What is integrated noise? the second part

Previously in the blog "What is LDO noise? In the first part, we talked about what noise is, how to classify it, and introduced the ultra-low noise low-dropout regulator provided by ON Semiconductor. Today, we will talk in further detail about what is integrated noise.

The integrated noise value is derived from the integral of the noise spectral density function. However, it is very complicated to use a function to represent any curve and integrate it. It is easier to divide the measurement curve into small parts. If the frequency difference of each part fn+1 – fn tends to 0, the sum of all contributions is equal to the integral of the function.


LDO noise, ON Semiconductor


LDO noise, ON Semiconductor


In actual measurement, it is impossible to achieve a zero frequency difference of fn+1 – fn, but it is possible to make it close to zero. The noise spectral density measurement has multiple points, which enables us to obtain a better accuracy of integrating noise and detecting oscillation peaks. In our example, we have 6,400 points in the frequency range of 10 Hz to 100 kHz. The noise spectral density curve is interpolated by 6,399 intervals, expressed as VNOISE,AVG,n.


LDO noise, ON Semiconductor


The figure below shows the noise spectral density of the NCP110 LDO regulator. If we insert the measured value of the NCP110 LDO regulator into the final equation, we will get the result of the integrated noise, as shown in the table below. Although the noise spectral density curve moves to a lower frequency due to the higher COUT value, the integrated noise increases. Why is this so? As shown in the figure below, you can see that this is because the peaks associated with IOUT and COUT have moved to the range of 10 Hz to 100 kHz, and the integrated noise is calculated in this range.


LDO noise, ON Semiconductor


Why not choose some LDOs with high output capacitance? As you can see, when the output capacitance value increases and the output current decreases, the peak value related to the output current and output capacitance will rise and move to the useful frequency range of 10 Hz to 100 kHz.

High output capacitance values, such as 10 uF, improve transient response. Better transient response may be one reason for using high output capacitor values. In this example, the NCP110 has ringing (more than one undershoot) and a longer settling time to transient events when using a higher output capacitance value, but it is still stable. The ringing increases the peak value and the integrated noise also increases, as shown in the following table. The NCP110 LDO regulator is designed for a lower output capacitance of 1 uF. The additional capacitance improves the transient response of the system, but affects the noise performance of the system.


LDO noise, ON Semiconductor


Integral noise is a way of expressing how much noise the LDO generates in a specific frequency range. Understanding how to measure this noise and the impact of system-level design choices is important when designing a clean power supply. Please continue to pay attention to the next article on power supply rejection ratio (PSRR), we will talk about how to measure and its impact on system-level design. In the meantime, please check our NCP110 data sheet to learn more about this topic.

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